Test-case reduction for C compiler bugs

John Regehr, Yang Chen, Pascal Cuoq, Eric Eide, Chucky Ellison, Xuejun Yang
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Proceedings of the 33rd ACM SIGPLAN Conference on Programming Language Design and Implementation
PLDI '12
Beijing, China
Association for Computing Machinery
New York, NY, USA
Pages 335-346
Note(s): test-case reduction, fuzz testing

Test-case reduction

  • Test-case reduction via test-case generation: Insights from the Hypothesis reducer [maciver:ecoop:2020]