Test-case reduction for C compiler bugs

John Regehr, Yang Chen, Pascal Cuoq, Eric Eide, Chucky Ellison, Xuejun Yang
[doi] [ISBN] [Google Scholar] [DBLP] [Citeseer] [url]

Proceedings of the 33rd ACM SIGPLAN Conference on Programming Language Design and Implementation
PLDI '12
Beijing, China
Association for Computing Machinery
New York, NY, USA
Pages 335-346
2012
Note(s): test-case reduction, fuzz testing

Test-case reduction

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