The effect of certain modular design principles on testability
N. P. Edwards[doi] [ISBN] [Google Scholar] [DBLP] [Citeseer] [url]
Proceedings of the International Conference on Reliable Software
Los Angeles, California
Association for Computing Machinery
New York, NY, USA
Pages 401-410
1975
Note(s): testability
Los Angeles, California
Association for Computing Machinery
New York, NY, USA
Pages 401-410
1975
Note(s): testability