Efficient sampling of SAT solutions for testing
Rafael Dutra, Kevin Laeufer, Jonathan Bachrach, Koushik Sen[doi] [ISBN] [Google Scholar] [DBLP] [Citeseer] [url]
Proceedings of the 40th International Conference on Software Engineering
ICSE '18
Gothenburg, Sweden
Association for Computing Machinery
New York, NY, USA
Pages 549-559
2018
Note(s): SAT solver, test generation
ICSE '18
Gothenburg, Sweden
Association for Computing Machinery
New York, NY, USA
Pages 549-559
2018
Note(s): SAT solver, test generation