Randomised testing of a microprocessor model using SMT-solver state generation
Brian Campbell, Ian Stark[doi] [Google Scholar] [DBLP] [Citeseer]
Formal Methods for Industrial Critical Systems (FMICS 2014)
Lecture Notes in Computer Science, volume 8718
Springer
Pages 185-199
2014
Lecture Notes in Computer Science, volume 8718
Springer
Pages 185-199
2014